Fingerprint Fingerprint is based on mining the text of the persons scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 11 Similar Profiles
Permanent magnets Engineering & Materials Science
Magnets Engineering & Materials Science
Rotors Engineering & Materials Science
Failure analysis Engineering & Materials Science
Switches Engineering & Materials Science
Costs Engineering & Materials Science
Synchronous motors Engineering & Materials Science
Induction motors Engineering & Materials Science

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Research Output 2003 2017

  • 867 Citations
  • 14 h-Index
  • 62 Conference contribution
  • 37 Article

A comprehensive study on variations of discrete IGBT characteristics due to package degradation triggered by thermal stress

Ali, S. H., Dusmez, S. & Akin, B. Feb 13 2017 ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings. Institute of Electrical and Electronics Engineers Inc., 7854665

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Insulated gate bipolar transistors (IGBT)
Threshold voltage
Degradation
Condition monitoring
Power converters

A diagnosis procedure in standstill mode for inter turn short circuit faults of PMSMs through modified self-commissioning

Qi, Y., Zafarani, M. & Akin, B. Feb 13 2017 ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings. Institute of Electrical and Electronics Engineers Inc., 7854673

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Short circuit currents
Stators
Inductance
Resistors
Program processors
1 Citations

Aging precursor identification and lifetime estimation for thermally aged discrete package silicon power switches

Dusmez, S., Ali, S. H., Heydarzadeh, M., Kamath, A. S., Duran, H. & Akin, B. Jan 1 2017 In : IEEE Transactions on Industry Applications. 53, 1, p. 251-260 10 p., 7552489

Research output: Contribution to journalArticle

Threshold voltage
Capacitance
Switches
Degradation
Oxides

A method for online ageing detection in SiC MOSFETs

Erturk, F. & Akin, B. May 17 2017 2017 IEEE Applied Power Electronics Conference and Exposition, APEC 2017. Institute of Electrical and Electronics Engineers Inc., p. 3576-3581 6 p. 7931211

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Power converters
Fault detection
Leakage currents
Degradation
Monitoring

A new LMS based algorithm to suppress dead-time effects in PMSM V/f drives

Tang, Z. & Akin, B. May 17 2017 2017 IEEE Applied Power Electronics Conference and Exposition, APEC 2017. Institute of Electrical and Electronics Engineers Inc., p. 3156-3162 7 p. 7931148

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Synchronous motors
Permanent magnets
Vector control (Electric machinery)
Spectrum analysis
Program processors