Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 12 Similar Profiles
Temperature Engineering & Materials Science
Transmission electron microscopy Engineering & Materials Science
Substrates Engineering & Materials Science
Thin films Engineering & Materials Science
transmission electron microscopy Physics & Astronomy
synthesis Physics & Astronomy
Metals Engineering & Materials Science
Annealing Engineering & Materials Science

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Research Output 1987 2017

  • 7548 Citations
  • 46 h-Index
  • 242 Article
  • 62 Conference contribution
  • 1 Chapter
  • 1 Short survey

(1 0 1) and (0 0 2) oriented AlN thin films deposited by sputtering

Taurino, A., Signore, M. A., Catalano, M. & Kim, M. J. Aug 1 2017 In : Materials Letters. 200, p. 18-20 3 p.

Research output: Research - peer-reviewArticle

aluminum nitrides
sputtering
thin films
Aluminum nitride
Sputtering
1 Citations

Compositionally graded InGaN layers grown on vicinal N-face GaN substrates by plasma-assisted molecular beam epitaxy

Hestroffer, K., Lund, C., Koksaldi, O., Li, H., Schmidt, G., Trippel, M., Veit, P., Bertram, F., Lu, N., Wang, Q., Christen, J., Kim, M. J., Mishra, U. K. & Keller, S. May 1 2017 In : Journal of Crystal Growth. 465, p. 55-59 5 p.

Research output: Research - peer-reviewArticle

Molecular beam epitaxy
Plasmas
Substrates
grade
molecular beam epitaxy
1 Citations

Contact resistance and stability study for Au, Ti, Hf and Ni contacts on thin-film Mg2Si

Zhang, B., Zheng, T., Wang, Q., Zhu, Y., Alshareef, H. N., Kim, M. J. & Gnade, B. E. Mar 30 2017 In : Journal of Alloys and Compounds. 699, p. 1134-1139 6 p.

Research output: Research - peer-reviewArticle

Contact resistance
Annealing
Thin films
Thermodynamic stability
Metals

Electrical transport characterization of Al and Sn doped Mg2Si thin films

Zhang, B., Zheng, T., Sun, C., Guo, Z., Kim, M. J., Alshareef, H. N., Quevedo-Lopez, M. & Gnade, B. E. 2017 In : Journal of Alloys and Compounds. 720, p. 156-160 5 p.

Research output: Research - peer-reviewArticle

Thin films
Doping (additives)
Carrier concentration
Charge carriers
Rutherford backscattering spectroscopy
2 Citations

Growth assessment of (002)-oriented AlN thin films on Ti bottom electrode deposited on silicon and kapton substrates

Signore, M. A., Taurino, A., Catalano, M., Kim, M., Che, Z., Quaranta, F. & Siciliano, P. Apr 5 2017 In : Materials and Design. 119, p. 151-158 8 p.

Research output: Research - peer-reviewArticle

Aluminum nitride
Titanium
Thin films
Silicon
Electrodes