Fingerprint Fingerprint is based on mining the text of the persons scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 12 Similar Profiles
Temperature Engineering & Materials Science
Transmission electron microscopy Engineering & Materials Science
Substrates Engineering & Materials Science
Thin films Engineering & Materials Science
Metals Engineering & Materials Science
Annealing Engineering & Materials Science
Nanocrystals Engineering & Materials Science
Erythrasma Chemical Compounds

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Research Output 1987 2017

  • 7171 Citations
  • 45 h-Index
  • 242 Article
  • 62 Conference contribution
  • 1 Chapter
  • 1 Short survey

(1 0 1) and (0 0 2) oriented AlN thin films deposited by sputtering

Taurino, A., Signore, M. A., Catalano, M. & Kim, M. J. Aug 1 2017 In : Materials Letters. 200, p. 18-20 3 p.

Research output: Contribution to journalArticle

Psychologic Desensitization
aluminum nitrides
Aluminum nitride
Blood Flow Velocity

Compositionally graded InGaN layers grown on vicinal N-face GaN substrates by plasma-assisted molecular beam epitaxy

Hestroffer, K., Lund, C., Koksaldi, O., Li, H., Schmidt, G., Trippel, M., Veit, P., Bertram, F., Lu, N., Wang, Q., Christen, J., Kim, M. J., Mishra, U. K. & Keller, S. May 1 2017 In : Journal of Crystal Growth. 465, p. 55-59 5 p.

Research output: Contribution to journalArticle

Molecular beam epitaxy
Surface morphology
1 Citations

Contact resistance and stability study for Au, Ti, Hf and Ni contacts on thin-film Mg2Si

Zhang, B., Zheng, T., Wang, Q., Zhu, Y., Alshareef, H. N., Kim, M. J. & Gnade, B. E. Mar 30 2017 In : Journal of Alloys and Compounds. 699, p. 1134-1139 6 p.

Research output: Contribution to journalArticle

Thin films
Contact resistance
Thermodynamic stability

Electrical transport characterization of Al and Sn doped Mg2Si thin films

Zhang, B., Zheng, T., Sun, C., Guo, Z., Kim, M. J., Alshareef, H. N., Quevedo-Lopez, M. & Gnade, B. E. 2017 In : Journal of Alloys and Compounds. 720, p. 156-160 5 p.

Research output: Contribution to journalArticle

Carrier concentration
Thin films
Buccal Administration
Charge carriers
2 Citations

Growth assessment of (002)-oriented AlN thin films on Ti bottom electrode deposited on silicon and kapton substrates

Signore, M. A., Taurino, A., Catalano, M., Kim, M., Che, Z., Quaranta, F. & Siciliano, P. Apr 5 2017 In : Materials and Design. 119, p. 151-158 8 p.

Research output: Contribution to journalArticle

Aluminum nitride
Thin films